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<dc:title xml:lang="en">Probing the impact of structural defects on spin dependent tunneling using photons</dc:title>
<dcterms:alternative xml:lang="fr">Impact des défauts structurels sur le transport tunnel polarisé en spin caractérisé par excitation optique</dcterms:alternative>
<dc:subject xml:lang="fr">Spintronique</dc:subject>
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<dc:subject xml:lang="fr">Jonctions tunnels magnétiques</dc:subject>
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<dc:subject xml:lang="fr">Photoluminescence</dc:subject>
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<dc:subject xml:lang="en">Magnetic tunnel junctions</dc:subject>
<dc:subject xml:lang="en">Defects</dc:subject>
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<dc:subject xml:lang="en">Photoluminescence</dc:subject>
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<dcterms:abstract xml:lang="en">The study of the impact of defects on the electrical properties of semiconductors played a crucial role in the revolution of information technologies in the middle of the 20th century. Up to now, the race to miniaturization allowed to meet the increasing demand in terms of processing power. However, this strategy is predicted to encounter physical limits impossible to overcome and new approaches are necessary. Within this new research paradigm, oxide based electronic devices are promising candidates to fabricate new multifunctional devices. The importance of defects on the nominal properties of oxides is not acknowledged as much as it is in the field of semiconductors. Our research project revolved around two primary objectives, the first one aimed to explicitly identify the impact of specific defects on the properties of oxide-based electronic devices. The second one aimed to actually take advantage of properties induced by defects for optoelectronic applications.</dcterms:abstract>
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