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<dc:title xml:lang="fr">Développement de la microscopie à force photo-induite dans le domaine spectrale du visible</dc:title>
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<dc:subject xml:lang="fr">Microscopie</dc:subject>
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<dc:subject xml:lang="fr">Optique</dc:subject>
<dc:subject xml:lang="fr">Opto-electronique</dc:subject>
<dc:subject xml:lang="fr">Nano-physique</dc:subject>
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<dc:subject xml:lang="fr">Spectroscopie</dc:subject>
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<tef:elementdEntree autoriteExterne="035772786" autoriteSource="Sudoc">Microscopie à force atomique</tef:elementdEntree>
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<dcterms:abstract xml:lang="fr">Les travaux de cette thèse sont consacrés à contribuer à un développement instrumental afin d’améliorer une technique récente de microscopie en champ proche : la microscopie à force photo-induite (PiFM). La technique consiste à détecter à l’aide d’une pointe AFM, les forces résultant des interactions dipolaires induites optiquement. Il est alors possible de cartographier, avec la résolution spatiale de l’AFM, la polarisabilité d’une surface, et donc les propriétés optiques de cette dernière. L’introduction d’un laser à longueur d’onde accordable dans le montage permet de suivre l’évolution spectrale de ces forces optiques, s’approchant d’une spectroscopie optique à l’échelle nanométrique. Le développement d’une telle technique offre ainsi des perspectives révolutionnaires en termes de caractérisations des propriétés opto-électroniques.</dcterms:abstract>
<dcterms:abstract xml:lang="en">This work proposes an instrumental contribution aiming to ameliorate a near field microscopytechnique : the photo-induced force microscopy (PiFM). This technique detects, with an AFM tip, le total force resulting of all dipolar interactions optically induced. It is then possible to map, with the spatial resolution of the AFM, the polarizability of a surface, which is dependant to the optical properties of a sample. The addition of a tuneable wavelength laser in the experimental setup allows us to follow the spectral evolution of the optical forces, aiming to an optical spectroscopy with nanoscale resolution. The development of such a technique offers new perspectives in terms of optoelectronic properties characterisations.</dcterms:abstract>
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